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Применение тонких сцинтилляционных счетчиков в детекторах частиц (обзор)
- Authors: Бреховских В.В.1, Горин А.М.1, Дятченко В.А.1, Евдокимов С.В.1, Зайцев А.А.2, Изучеев В.И.1, Медынский М.В.1, Рыкалин В.И.1, Садовский С.А.1, Шангараев А.А.1
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Affiliations:
- Институт физики высоких энергий им. А.А. Логунова Национального исследовательского центра “Курчатовский институт”
- Объединенный институт ядерных исследований
- Issue: No 4 (2024)
- Pages: 5-14
- Section: Articles
- URL: https://freezetech.ru/0032-8162/article/view/681064
- DOI: https://doi.org/10.31857/S0032816224040019
- EDN: https://elibrary.ru/NZPSXG
- ID: 681064
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Fig. 1. FEU-KS photomultiplier tube
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Fig. 2. General view photo of a thin scintillation counter with the scintillator working area of 1 × 200 × 300 mm3
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Fig. 3. General view of the thin counter located in front of the target of the Hyperon-M unit
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Fig. 4. Photo of beta contamination measurement with the detector
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Fig. 5. View of the detector counters: the reflector films of the left and right counters are removed, the right counter is removed from the housing
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Fig. 6. View of beta contamination detector counter with ‘house’ - reflector made of aluminised lavsan
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Fig. 7. General view of the target assembly of the Hyperon+ installation on the U-70 channel 18: red colour shows longitudinal counters of the charged particle veto-detector, black tubes - scintillation counters on the basis of NaI and BGO crystals, panel with amplifiers for SiPM is visible at the bottom
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Fig. 8. Photo of the longitudinal thin veto detector counter without light-insulating paper and reflective (Tyvek) wrapping
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Fig. 9. Photo of the longitudinal thin counter of the veto detector assembly
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Fig. 10. Photo of the general view of the counter without reflective and light-protective wrapping: scintillation plate with WLS-fibres, two SiPMs, to which the ends of fibres are attached, and electronic module
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Fig. 11. Photo of the general view of the meter assembly
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Fig. 12. Count rate (at bias voltage of 30.5 V) as a function of the discrimination threshold of the formers: the line with round markers - counting of noise and natural radioactive background of the counter with dimensions 50 × 500 × 500 mm3, using WLS and one SiPM, the line with square markers - intrinsic noise counting of the isolated SiPM
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Fig. 13. Calibration spectrum at a small number of photoelectrons. The left peak in the spectrum corresponds to the pedestal, the subsequent ones to the pulses of one-photoelectron signals, two-photoelectron signals, and so on
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Fig. 14. Amplitude spectrum of the sum of signals of both SiPMs at registration of radiation from the 207Bi source
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Fig. 15. Amplitude spectrum of the sum of signals of both SiPMs at registration of radiation from a 207Bi source with a plex filter
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Fig. 16. Dependences of electron registration efficiency on their energy at SiPM bias voltage values of 30 V: square markers - results of contamination counter efficiency measurements. The dotted, dashed, solid and the line passing through the experimental points correspond to the calculated results of the probability of events with pfe ≥ 3 obtained for the average values of the numbers of photoelectrons registered by each SiPM equal to 142, 97, 77 and 45
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