Abstract
A system of equations with nonlinearity with respect to the potential of the electric field and temperature is proposed, describing the heating process of semiconductor elements of an electric board, and over time, thermal and electrical “breakdowns” may occur. The paper considers a method for the numerical diagnosis of solution destruction. In the process of numerical investigation of this problem, an approach was used based on the reduction of the initial system of partial differential equations to a differential algebraic system, followed by the solution of this system using a one-stage Rosenbrock scheme with a complex coefficient. Numerical diagnostics of the destruction of the exact solution of the specified system of equations was based on the method for calculating a posteriori asymptotically accurate error estimate obtained when calculating an approximate solution on successively thickening grids. Numerical estimates of the moment of destruction are obtained for various initial conditions.